The roughening kinetics of gold deposits grown from vapor was studied by scanning tunneling microscopy. The dynamic scaling yielded the following growth exponents α(I)=0.90±0.06 and β(I)=0.25±0.06 for Ls>ds, and α(II)=0.37±0.05 and β(II)=0.45±0.06 for Ls>ds, where Ls is the scan length and ds is the average diameter of columns. The scaling properties of the domain-dependent-surface roughness exponents allowed us to give the rationale for experimental data on the fractal behavior of thin metal films.