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dc.date.accessioned 2022-10-12T12:44:53Z
dc.date.available 2022-10-12T12:44:53Z
dc.date.issued 2013
dc.identifier.uri http://sedici.unlp.edu.ar/handle/10915/143615
dc.description.abstract Femtosecond laser material processing as micromachining and nanoparticles fabrication require a careful control of the fluences deposited on the samples. In many cases, best results are obtained by using fluences slightly above the Laser Ablation Threshold (LAT), therefore its accurate determination is an important requirement. LAT can be obtained by measuring the intensity of the acoustic signal generated during the ablation process as a function of the laser fluence. In this work femtosecond laser ablation thresholds of commercially polished stainless steel plates, white high impact polystyrene, frosted glass, antique rag papers and silicon oxynitride thin films were determined by using laser ablation induced photoacoustics (LAIP). Results were compared with similar data previously obtained by using a nanosecond Nd:YAG laser. en
dc.format.extent 735-739 es
dc.language en es
dc.subject Laser Ablation es
dc.subject Femtosecond Laser es
dc.subject Acoustic Signal es
dc.subject Laser Fluence es
dc.subject Ablation Process es
dc.title Determination of femtosecond ablation thresholds by using laser ablation induced photoacoustics (LAIP) en
dc.type Articulo es
sedici.identifier.other doi:10.1007/s00339-012-7230-x es
sedici.identifier.issn 0947-8396 es
sedici.identifier.issn 1432-0630 es
sedici.identifier.issn 1996-0948 es
sedici.creator.person Orzi, Daniel Jesús Omar es
sedici.creator.person Alvira, Fernando Carlos es
sedici.creator.person Bilmes, Gabriel Mario es
sedici.subject.materias Física es
sedici.description.fulltext true es
mods.originInfo.place Centro de Investigaciones Ópticas es
sedici.subtype Articulo es
sedici.rights.license Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
sedici.rights.uri http://creativecommons.org/licenses/by-nc-sa/4.0/
sedici.description.peerReview peer-review es
sedici.relation.journalTitle Applied Physics A es
sedici.relation.journalVolumeAndIssue vol. 110, no. 3 es


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