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dc.date.accessioned 2015-03-05T16:44:14Z
dc.date.available 2015-03-05T16:44:14Z
dc.date.issued 2003-10
dc.identifier.uri http://sedici.unlp.edu.ar/handle/10915/44355
dc.description.abstract The random walk model is employed to simulate modulated speckle patterns. We demonstrate that the geo metrical image approximation fails to describe the modulated speckle pattern. A new approach to analyzing this phenomenon is proposed. The validity of the approximations employed is verified by comparison of the simulation with the experimental results. Speckle metrological applications and phase measurement tech niques could be improved by taking advantage of this model. en
dc.format.extent 501-503 es
dc.language en es
dc.subject óptica es
dc.subject patrones de speckle modulados es
dc.subject paseo aleatorio es
dc.title Modulated speckle simulations based on the random-walk model en
dc.type Articulo es
sedici.identifier.other https://doi.org/10.1364/OL.28.001748
sedici.identifier.issn 1539-4794 es
sedici.creator.person Lencina, Alberto es
sedici.creator.person Vaveliuk, Pablo es
sedici.creator.person Tebaldi, Myrian Cristina es
sedici.creator.person Bolognini, Néstor Alberto es
sedici.subject.materias Ciencias Exactas es
sedici.subject.materias Ingeniería es
sedici.description.fulltext true es
mods.originInfo.place Facultad de Ingeniería es
sedici.subtype Articulo es
sedici.rights.license Creative Commons Attribution 4.0 International (CC BY 4.0)
sedici.rights.uri http://creativecommons.org/licenses/by/4.0/
sedici.description.peerReview peer-review es
sedici.relation.journalTitle Optics Letters es
sedici.relation.journalVolumeAndIssue vol. 28, no. 19 es


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Creative Commons Attribution 4.0 International (CC BY 4.0) Excepto donde se diga explícitamente, este item se publica bajo la siguiente licencia Creative Commons Attribution 4.0 International (CC BY 4.0)