Busque entre los 166448 recursos disponibles en el repositorio
Mostrar el registro sencillo del ítem
dc.date.accessioned | 2019-08-15T14:43:39Z | |
dc.date.available | 2019-08-15T14:43:39Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | http://sedici.unlp.edu.ar/handle/10915/79195 | |
dc.description.abstract | Scattering is a useful tool for the determination of particle size in solution. In particular, spectroscopic analysis of backscattering renders the possibility of a simplified experimental setup and direct data processing using Mie theory. We show that a simple technique based on near-infrared (NIR) backscattering spectroscopy together with the development of the corresponding algorithm based on Fourier transform (FT) and Mie theory are a powerful tool for sizing microparticles in the range from 8 to 60 microm diameter. There are three wavelength intervals in the NIR, within which different diameter ranges were analyzed. In each one, the FT yields a coarse diameter value with an uncertainty dependent on the wavelength range. A more accurate value is obtained by further applying cross correlation between experimental and theoretical spectra. This latter step reduces the uncertainty in diameter determination between 30% and 40%, depending on wavelength interval and particle diameter. These results extend previous information on visible backscattering spectroscopy applied to sizing microparticles in the range between 1 and 24 mum diameter. This technique could be the basis for the construction of a portable and practical instrument. | en |
dc.format.extent | 67-75 | es |
dc.language | en | es |
dc.subject | particle size determination | es |
dc.subject | spectroscopic analysis of backscattering | es |
dc.subject | wavelength interval | es |
dc.title | Visible and near-infrared backscattering spectroscopy for sizing spherical microparticles | en |
dc.type | Articulo | es |
sedici.identifier.other | https://doi.org/10.1364/AO.46.000067 | |
sedici.identifier.other | http://hdl.handle.net/11746/566 | |
sedici.creator.person | Scaffardi, Lucía Beatriz | es |
sedici.creator.person | Videla, Fabián Alfredo | es |
sedici.creator.person | Schinca, Daniel Carlos | es |
sedici.subject.materias | Ingeniería | es |
sedici.description.fulltext | true | es |
mods.originInfo.place | Facultad de Ingeniería | es |
sedici.subtype | Articulo | es |
sedici.rights.license | Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0) | |
sedici.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | |
sedici.description.peerReview | peer-review | es |
sedici.relation.journalTitle | Applied Optics | es |
sedici.relation.journalVolumeAndIssue | vol. 46, no. 1 | es |