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dc.date.accessioned 2019-08-26T13:54:37Z
dc.date.available 2019-08-26T13:54:37Z
dc.date.issued 2008-08-20
dc.identifier.uri http://sedici.unlp.edu.ar/handle/10915/79743
dc.description.abstract Copper electrodeposition on copper from still plating solutions of different compositions was investi- gated utilising electrochemical impedance spectroscopy (EIS), cyclic voltammetry, and scanning electron microscopy (SEM). An acid copper sulphate plating base solution was employed either with or without sodium chloride in the presence of a single additive, either polyethylene glycol (PEG) or 3-mercapto-2- propanesulphonic acid (MPSA), and their mixture. Thallium underpotential deposition/anodic stripping was employed to determine the adsorption capability of additives on copper. In the absence of chloride ions, MPSA shows a moderate adsorption on copper, whereas PEG is slightly adsorbed. At low cathodic overpotentials, the simultaneous presence of MPSA and chloride ions accelerates copper electrodeposition through the formation of an MPSA-chloride ion complex in the solution, particularly for about 220 mM sodium chloride. The reverse effect occurs in PEG-sodium chloride plating solutions. In this case, from EIS data the formation of a film that interferes with copper electrodeposition can be inferred. At higher cathodic overpotentials, when copper electrodeposition is under mass transport control, the cathode coverage by a PEG-copper chloride-mediated film becomes either partially or completely detached as the concentration of chloride ions at the negatively charged copper surface diminishes. The copper cathode grain topography at the mm scale depends on the cathodic overpotential, plating solution composition and average current density. Available data about the solution constituents and their adsorption on copper make it possible to propose a likely complex mechanism to understand copper electrodeposition from these media, including the accelerating effect of MPSA and the dynamics of PEG-copper chloride complex adsorbate interfering with the surface mobility of depositing copper ad-ions/ad-atoms. en
dc.format.extent 5891-5904 es
dc.language en es
dc.subject Cobre es
dc.subject electrodeposition es
dc.subject electrochemical impedance spectroscopy es
dc.subject scanning electron microscopy es
dc.subject Sulfato de Cobre es
dc.subject polyethylene glycol es
dc.title Copper electrodeposition from an acidic plating bath containing accelerating and inhibiting organic additives en
dc.type Articulo es
sedici.identifier.other https://doi.org/10.1016/j.electacta.2008.03.073
sedici.identifier.issn 0013-4686 es
sedici.creator.person Pasquale, Miguel Ángel es
sedici.creator.person Gassa, Liliana Mabel es
sedici.creator.person Arvia, Alejandro Jorge es
sedici.subject.materias Ciencias Exactas es
sedici.subject.materias Química es
sedici.description.fulltext true es
mods.originInfo.place Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas (INIFTA) es
mods.originInfo.place Facultad de Ciencias Exactas es
sedici.subtype Articulo es
sedici.rights.license Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
sedici.rights.uri http://creativecommons.org/licenses/by-nc-sa/4.0/
sedici.description.peerReview peer-review es
sedici.relation.journalTitle Electrochimica Acta es
sedici.relation.journalVolumeAndIssue vol. 53, no. 20 es


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Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0) Excepto donde se diga explícitamente, este item se publica bajo la siguiente licencia Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)